Many businesses have not yet fully recovered from the Great Recession, and they are still looking for ways to cut their budgets. All…
Category: Uncategorized
03.21.2012
Zekiah President, Brianna Bowling, one of Most Influential Marylanders of 2012
The Daily Record announced on January 25th that Brianna Bowling is one of the Most Influential Marylanders for 2012. The Daily Record’s editors…
03.21.2012
Optech Announces Optech FMS, a New Lidar/Camera Flight Management System
Toronto, Canada, March 21, 2012 — Optech, the world leader in the development, manufacture and support of advanced lidar and camera survey instruments,…
03.20.2012
BAE Systems Delivers Software to Forward-Deployed Warfighters to Expedite Data Searches
San Diego, California – The U.S. Army has procured BAE Systems’ commercial data management software, GXP Xplorer, to reduce the efforts required to…
03.20.2012
US Imaging Invests in Optech Lidar-Camera System
Toronto, Canada, March 20, 2012 — Optech, the world leader in the development, manufacture and support of advanced lidar and camera survey instruments,…
03.20.2012
Golden Software Announces Full User’s Guides for Strater 3 and Voxler 3
Golden, Colorado, 20 March 2012 – Golden Software, Inc., the leading developer of affordable scientific graphics software, announces the availability for Strater® 3…
03.20.2012
Blue Marble to Exhibit at the 2012 ASPRS Conference in Sacramento
Gardiner, Maine – March 20, 2012 – Blue Marble Geographics (www.bluemarblegeo.com) will be exhibiting at the American Society for Photogrammetry and Remote Sensing…
03.20.2012
AVEVA and LFM Software Showcases Laser Products at SPAR International 2012
Visit booth 44 to discover the latest laser technology developments
03.20.2012
SPARVlog, SPAR Point Group’s Video Blog, Named Jesse H. Neal National Business Journalism Award Winner
March 19, 2012 (New York, New York) – The SPARVlog was named a Neal Award winner on Friday by American Business Media (ABM)…
03.19.2012
Metrology Speaker Agenda Published for Hexagon 2012 International Conference
Lineup to include metrology experts and users, techniques, and applications
