Follows signing of interoperability agreement and LFM Software acquisition
Cambridge, UK – 9 February 2012: AVEVA (LSE:AVV), announced today that it will exhibit at the FARO 3D Documentation Conference. Attending this important event follows the signing of an interoperability agreement between AVEVA and FARO in December 2011 and AVEVA’s acquisition of the LFM Software business from Z+F GmbH in October 2011.
“AVEVA and LFM will demonstrate its entire laser scanning solution with the theme “Two Worlds Combine” following the acquisition of LFM Software last year”, said Gary Farrow, VP 3D Data Capture for LFM Software. “By demonstrating our hardware neutral software, we are showing our support to all hardware vendors, including FARO. 3D laser scanning is helping owner operators improve the efficiency and extend the life of their aging plant assets by capturing as-built environments and creating accurate 3D data and models. We are very much looking forward to this opportunity to showcase our unique products and partnership, as well as continuing to work closely with FARO in the future”.
“FARO is very happy that AVEVA, as one of the leaders in engineering design and information management solutions, is attending our 3D Documentation Conference”, added Oliver Bürkler, Senior Technical Product Manager, Laser Scanner, FARO. “Presenting the new point cloud capabilities of AVEVA’s software will pave the way for even greater adoption of this exciting technology”.
The FARO 3D Documentation conference will be held at the Gaylord Palms Resort and Convention Center, Orlando, FL.21-22 February, 2012.
To learn more visit – http://www.aveva.com/events
LFM is a powerful 3D laser scanning software package, which allows users to import 3D data from numerous 3D laser scanning formats, and export to 3D plant design integrated systems, and CAD platforms.
About AVEVA
AVEVA is trusted around the world to deliver engineering design and information management solutions with strategic value to leading companies in the plant and marine industries. For further information please visit www.aveva.com or www.aveva.com/ednotes